Published September 1992 | Version v1
Journal article Metadata-only

BSRL laboratory XAFS spectrometer

Creators

  • 1. Academia Sinica, Beijing, BJ (China). Inst. of High Energy Physics

Description

A laboratory X-ray absorption spectrometer is described which consists of optics machine with Johansson-cut bent crystal, MWPC and NaI(Tl) scintillation counter, fast electronics with wide linearity extent, motor controller and it is power supply, computer online software pocket. MWPC and NaI(Tl) scintillation counter are available for harmonics depressing while maintaining a high source voltage necessary for strong X-ray flux, and can discriminate undesired reflections. Fast electronics is used to keep up with high X-ray intensity. To do experiment by means of the spectrometer, time needed and XAFS spectra quality are comparable with facilities on beam line of synchrotron radiation

Additional details

Publishing Information

Journal Title
Nuclear Electronics and Detection Technology
Journal Volume
12
Journal Issue
suppl.
Journal Page Range
p. 630-636.
ISSN
0258-0934
CODEN
HDYUEC

Conference

Title
6. national conference on nuclear electronic and nuclear detection technology (B).
Dates
21-26 Sep 1992.
Place
Weihai (China).

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
26002171
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION SPECTROSCOPY; COMPUTERIZED CONTROL SYSTEMS; M CODES; MONOCHROMATORS; MULTIWIRE PROPORTIONAL CHAMBERS; NAI DETECTORS; ON-LINE SYSTEMS; OPTICAL SYSTEMS; PERFORMANCE TESTING; SCINTILLATION COUNTERS; SYNCHROTRON RADIATION SOURCES; X-RAY SPECTROMETERS
Descriptors DEC
COMPUTER CODES; CONTROL SYSTEMS; MEASURING INSTRUMENTS; ON-LINE CONTROL SYSTEMS; PROPORTIONAL COUNTERS; RADIATION DETECTORS; RADIATION SOURCES; SOLID SCINTILLATION DETECTORS; SPECTROMETERS; SPECTROSCOPY; TESTING