Concentration Dependent Structural, Morphological, Spectral, Optical and Electrical Properties of Spray Pyrolyzed NiO thin films
Creators
- 1. Bharathiar University, Research and Development Center (India)
- 2. Government Arts College, PG and Research Department of Physics (India)
Description
Nickel oxide (NiO) thin films were prepared by spray pyrolysis technique using a solution of nickel (II) chloride hexahydrate (NiCl2.6H2O) and distilled water on glass substrates. The substrate temperature during deposition was maintained at 450 ∘C. The effect of solution concentration on the structural, morphological, elemental, spectral, optical and electrical properties of the NiO films were studied for different concentrations from 0.1 M to 0.3 M by XRD, SEM, EDX, FTIR, UV-vis-NIR spectrophotometer, Hot probe and Hall effect measurement system. The XRD study reveals that the NiO films are polycrystalline in nature with cubic structure. Also, the crystallite size increases with the increase in solution concentration. According to SEM, the increase in grain size clearly shows the effect of solution concentration. The elemental composition of the film was determined by EDX. FTIR study shows the presence of chemical identification. The optical band gap decreases while the absorption increases with the increase in solution concentration. The electrical study shows that all the NiO films are p-type. However, resistivity, carrier concentration and carrier mobility of the NiO films depend on the solution concentration.
Additional details
Identifiers
Publishing Information
- Journal Title
- Silicon (Online)
- Journal Volume
- 10
- Journal Issue
- 5
- Journal Page Range
- p. 2023-2029
- ISSN
- 1876-9918
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51028170
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CARRIER MOBILITY; DEPOSITION; FOURIER TRANSFORM SPECTROMETERS; GLASS; GRAIN SIZE; HALL EFFECT; INFRARED SPECTRA; NEAR INFRARED RADIATION; NICKEL CHLORIDES; NICKEL OXIDES; POLYCRYSTALS; PYROLYSIS; SCANNING ELECTRON MICROSCOPY; SPECTROPHOTOMETERS; THIN FILMS; ULTRAVIOLET RADIATION; WATER; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL REACTIONS; CHLORIDES; CHLORINE COMPOUNDS; COHERENT SCATTERING; CRYSTALS; DECOMPOSITION; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; FILMS; HALIDES; HALOGEN COMPOUNDS; HYDROGEN COMPOUNDS; INFRARED RADIATION; MEASURING INSTRUMENTS; MICROSCOPY; MICROSTRUCTURE; MOBILITY; NICKEL COMPOUNDS; NICKEL HALIDES; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; SCATTERING; SIZE; SPECTRA; SPECTROMETERS; THERMOCHEMICAL PROCESSES; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2018 Springer Science+Business Media B.V., part of Springer Nature