Published January 1985 | Version v1
Report Open

Electron microscopy of some irradiated solids

Creators

Description

Are studied defects induced by ''in situ'' irradiation in a High Tension Electron Microscope (1MV) in various materials such as: metals and usual alloys for nuclear reactors, low dimensional conductors, organic conductors. The migration energy for interstitial in stainless steels is 0.8 eV for a synthetic austenitic steel and 2.0 eV for an industrial titanium steel. Irradiation damage of low dimensional compounds, TaS2 and TaS3 are studied as a function of temperature and irradiation dose. Modifications of surstructure diffraction spots and the progressive disappearance of ordered phases of Charge Density Wave are observed. Electron diffraction pattern of crystalline organic compouds very sensitive to irradiation are obtained at 7K. Classification according to decreaseing sensitivity is Qsub(n)-(TCNQ)2 → TM-TSF-DM-TCNQ → TTF-TCNQ → TTT2I3

Availability note (English)

MF available from INIS under the Report Number.

Abstract (French)

On etudie les defauts produits par irradiation ''in situ'' dans un miscroscope electronique a haute tension (1MV) dans des materiaux varies: metaux et alliages traditionnels des reacteurs nucleaires, conducteurs de basse dimensionalite, composes organiques conducteurs. Par analyse des zones denudees en boucles de dislocation, on a determine dans des aciers inoxydables une energie de migration de l'interstitiel de 0,8 eV pour une austenite de synthese et de 2,0 eV pour un acier industriel au titane. L'endommagement de composes de basse dimensionalite, TaS2 TaS3 par irradiation a ete suivi en fonction de la temperature et de la dose par l'etude de l'evolution des taches de surstructure et la disparition progressive des phases ordonnees de l'onde de densite de charge. Enfin on a obtenu a 7K les cliches de microdiffraction a l'etat cristallin de composes organiques tres sensibles a l'irradiation. On a pu classer ces composes par ordre de sensibilite decroissante aux electrons: Qsub(n)-(TCNQ)2 → TM-TSF-DM-TCNQ → TTF-TCNQ → TTT2I3

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Additional details

Additional titles

Original title (French)
Microscopie electronique de quelques solides irradies

Publishing Information

Imprint Pagination
89 p.
Report number
CEA-R--5292

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
16045096
Subject category
S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Thesis
Descriptors DEI
AUSTENITE; AUSTENITIC STEELS; BRAGG CURVE; CYCLOALKENES; ELECTRIC CONDUCTIVITY; ELECTRON MICROSCOPY; ELECTRONS; HETEROCYCLIC COMPOUNDS; NITRILES; ORGANIC SULFUR COMPOUNDS; PHASE STUDIES; PHYSICAL RADIATION EFFECTS; POINT DEFECTS; TANTALUM SULFIDES
Descriptors DEC
ALKENES; ALLOYS; CARBON ADDITIONS; CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIAGRAMS; ELECTRICAL PROPERTIES; ELEMENTARY PARTICLES; FERMIONS; HYDROCARBONS; INFORMATION; IRON ALLOYS; IRON BASE ALLOYS; LEPTONS; MICROSCOPY; ORGANIC COMPOUNDS; ORGANIC NITROGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATION EFFECTS; STEELS; SULFIDES; SULFUR COMPOUNDS; TANTALUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS