Published February 2010 | Version v1
Journal article Metadata-only

Simulation of scanning transmission electron microscope images on desktop computers

Creators

  • 1. Monash Centre for Electron Microscopy, Department of Materials Engineering, Monash University, Victoria 3800 (Australia)

Description

Two independent strategies are presented for reducing the computation time of multislice simulations of scanning transmission electron microscope (STEM) images: (1) optimal probe sampling, and (2) the use of desktop graphics processing units. The first strategy is applicable to STEM images generated by elastic and/or inelastic scattering, and requires minimal effort for its implementation. Used together, these two strategies can reduce typical computation times from days to hours, allowing practical simulation of STEM images of general atomic structures on a desktop computer.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2009.11.009

Additional details

Identifiers

DOI
10.1016/j.ultramic.2009.11.009;
PII
S0304-3991(09)00254-X;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
110
Journal Issue
3
Journal Page Range
p. 195-198
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44102697
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
CALCULATION METHODS; COMPUTER CALCULATIONS; COMPUTERIZED SIMULATION; ELASTIC SCATTERING; IMAGES; IMPLEMENTATION; INELASTIC SCATTERING; PROBES; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
ELECTRON MICROSCOPY; MICROSCOPY; SCATTERING; SIMULATION

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.