Published January 21, 1999
| Version v1
Journal article
A time-of-flight spectrometer for investigations on liquid metal ion sources
Creators
- 1. Paul Scherrer Institute, ETH-Hoenggerberg, Zurich (Switzerland)
- 2. Institute of Particle Physics, ETH-Hoenggerberg, Zurich (Switzerland)
Description
A time-of-flight spectrometer with differential pulse sweeping was developed for the mass and energy analysis of ions emitted from liquid metal ion sources. The system was tested with a gallium liquid metal ion source. The angular intensity of the total source current, the mass spectra and the energy spread for Ga2+, Ga+ , and Ga2+ as function of source current have been measured. A mass and energy resolution of about 700 has been obtained independent of the ion mass. (author)
Availability note (English)
Available online at the Web site for the Journal of Physics. D, Applied Physics (ISSN 1361-6463) http://www.iop.org/Additional details
Identifiers
- URL
- http://www.iop.org/;
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 32
- Journal Issue
- 2
- Journal Page Range
- p. 161-167
- ISSN
- 0022-3727
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- Guatemala
- INIS RN
- 33011773
- Subject category
- S43: PARTICLE ACCELERATORS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BEAM PRODUCTION; GALLIUM IONS; ION SOURCES; LIQUID METALS; MASS SPECTROSCOPY; MULTICHARGED IONS; TIME-OF-FLIGHT SPECTROMETERS
- Descriptors DEC
- CHARGED PARTICLES; ELEMENTS; FLUIDS; IONS; LIQUIDS; MEASURING INSTRUMENTS; METALS; SPECTROMETERS; SPECTROSCOPY