Enhanced magnetic signal along edges of embedded epitaxial La0.7Sr0.3MnO3 nanostructures
Creators
- 1. Department of Electronic Systems, NTNU – Norwegian University of Science and Technology, 7491 Trondheim (Norway)
- 2. Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)
Description
Highlights: • Enhanced magnetic dichroism signal is found along edges of embedded LSMO nanomagnets. • XRD measurements reveal asymmetric changes to lattice parameters. • Magnetic domains near edges reorganize close to TC. When thin films are patterned to realize nanoscale device geometries, maintaining their structural integrity is key to the quality of their functional properties. The introduction of new surfaces and interfaces by lateral modifications may alter material properties as well as the expected device functionality. In this study, two different techniques for nanoscale patterning of epitaxial thin films of La0.7Sr0.3MnO3 are used to investigate the effects on their ferromagnetic properties and film crystalline structure. Nanomagnets are realized as free-standing structures and embedded ferromagnets in a paramagnetic matrix, respectively. We find that the magnetic dichroism signal in x-ray spectomicroscopy is stronger along the edges of the embedded magnets close to TC. X-ray-diffraction measurements reveal a reduction of their in-plane lattice parameters. We discuss how in-plane stress from the nanomagnet surroundings can affect the magnetic properties in these structures.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jmmm.2020.167324Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2020.167324;
- PII
- S0304885320322915;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 521
- Journal Page Range
- vp.
- ISSN
- 0304-8853
- CODEN
- JMMMDC
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54043068
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ASYMMETRY; EMISSION SPECTROSCOPY; EPITAXY; INTERFACES; LATTICE PARAMETERS; MAGNETIC CIRCULAR DICHROISM; MAGNETIC PROPERTIES; MAGNETS; NANOSTRUCTURES; PARAMAGNETISM; PHOTOELECTRON SPECTROSCOPY; STRESSES; THIN FILMS; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL GROWTH METHODS; DICHROISM; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; EQUIPMENT; FILMS; IONIZING RADIATIONS; MAGNETISM; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2020 The Author(s). Published by Elsevier B.V.