Published December 1, 2007 | Version v1
Journal article

Technology of the LSST focal plane

  • 1. Brookhaven National Laboratory, Upton, NY 11973 (United States)
  • 2. Harvard-Smithsonian Center for Astrophysics, Cambridge, MA 02138 (United States)
  • 3. Stanford Linear Accelerator Center, Menlo Park, CA 94025 (United States)
  • 4. Harvard University Laboratory for Particle Physics and Cosmology, Cambridge, MA 02138 (United States)

Description

The Large Synoptic Survey Telescope, now in the research and development phase, will undertake a wide angle, deep survey of the entire southern sky starting in 2014. The survey database will support a wide variety of astrophysical investigations, with particular emphasis on elucidating the nature of dark energy. To achieve its science goals, LSST will incorporate a silicon-based focal plane with unprecedented size (3 Gpixel), speed (2 s readout), and sensitivity (high QE over 350-1000 nm wavelength). The technologies to be used in the LSST camera are described, with an emphasis on the silicon sensors and readout electronics

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2007.07.120

Additional details

Identifiers

DOI
10.1016/j.nima.2007.07.120;
PII
S0168-9002(07)01598-7;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
582
Journal Issue
3
Journal Page Range
p. 902-909
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
15. international workshop on vertex detectors
Acronym
VERTEX 2006
Dates
25-29 Sep 2006
Place
Perugia (Italy)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39066054
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ASTROPHYSICS; CAMERAS; NONLUMINOUS MATTER; READOUT SYSTEMS; SENSITIVITY; SENSORS; SILICON; SKY; TELESCOPES; VELOCITY; WAVELENGTHS
Descriptors DEC
ELEMENTS; MATTER; PHYSICS; SEMIMETALS

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.