Published February 1, 2011 | Version v1
Journal article Metadata-only

Optical properties of BiCrxFe1-xO3 films grown by sol-gel method

Creators

  • 1. Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, 500 Dongchuan Road, Shanghai 200241 (China)
  • 2. Key Laboratory for Material Microstructures of Shanghai University, Shanghai University, 99 Shangda Rd, Shanghai 200444 (China)

Description

The BiCrxFe1-xO3 thin films were fabricated on Si substrate by sol-gel method with x range from 0 to 0.05. X-ray diffraction analysis shows that both pure BiFeO3 thin film and Cr-doped BiFeO3 thin films have rhombohedral structure with space group R3c. Moreover, the influence of different values of x on the extinction coefficient and refractive index were investigated in order to exploit their possible application in optoelectronic devices. The optical constants of the Cr-doped BiFeO3 thin films in the wavelength range 500-1100 nm were obtained by spectroscopic ellipsometry, and the band-gap energy of BiCr0.03Fe0.97O3 was found to be 2.40 ±0.02 eV, and that of BiCr0.05Fe0.95O3 was 2.30 ±0.02 eV.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/276/1/012162

Additional details

Identifiers

DOI
10.1088/1742-6596/276/1/012162;

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
276
Journal Issue
1
Journal Page Range
[5 p.]
ISSN
1742-6596

Conference

Title
3. international Photonics and OptoElectronics Meetings
Acronym
POEM 2010
Dates
2-5 Nov 2010
Place
Wuhan (China)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43044771
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BISMUTH COMPOUNDS; CHROMIUM COMPOUNDS; DOPED MATERIALS; ELLIPSOMETRY; IRON COMPOUNDS; OPTICAL PROPERTIES; OXYGEN COMPOUNDS; REFRACTIVE INDEX; SILICON; SOL-GEL PROCESS; SPACE GROUPS; SUBSTRATES; THIN FILMS; TRIGONAL LATTICES; WAVELENGTHS; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIFFRACTION; ELEMENTS; FILMS; MATERIALS; MEASURING METHODS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; SCATTERING; SEMIMETALS; SYMMETRY GROUPS; TRANSITION ELEMENT COMPOUNDS