Published March 2007
| Version v1
Journal article
Nanosized magnetization measurement of an isolated Co-Fe circular dot using a MFM tip
Creators
- 1. Department of Materials Science and Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871 (Japan)
- 2. Science and Technology Center for Atoms, Molecules and Ion Control, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871 (Japan)
Description
We used our newly proposed measurement method, which employs a magnetic force microscopy (MFM) tip as a detector, to investigate the magnetic state of an isolated Co-Fe dot. As the magnetic field is changed from positive to negative or vice versa, the phases (stray fields) change for all points within the dot that are perpendicular to the magnetic filed. In particular, a sharp jump is observed at the edge of the dot. These results are attributed to the movement of the vortex core in the dot and the annihilation of the vortex core in the dot edge
Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2006.10.1031;
- PII
- S0304-8853(06)02126-3;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 310
- Journal Issue
- 2
- Journal Page Range
- p. 2436-2438
- ISSN
- 0304-8853
- CODEN
- JMMMDC
Conference
- Title
- 17. international conference on magnetism
- Dates
- 20-25 Aug 2006
- Place
- Kyoto (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39026900
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNIHILATION; ATOMIC FORCE MICROSCOPY; COBALT ALLOYS; IRON ALLOYS; MAGNETIC FIELDS; MAGNETIZATION; NANOSTRUCTURES; VORTICES
- Descriptors DEC
- ALLOYS; INTERACTIONS; MICROSCOPY; PARTICLE INTERACTIONS; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.