Published June 2006
| Version v1
Journal article
Selection of methods for etching carbides in MAR-M509 cobalt-base superalloy and acquisition of their images
Creators
- 1. Silesian University of Technology, Department of Materials Science, Krasinskiego 8, 40-019 Katowice (Poland)
Description
The paper summarizes results of research into conditions for selectively revealing carbides and carbide eutectics occurring in the structure of MAR-M509 cobalt-base alloy as well as conditions for their detection. Also discussed are the various conditions for acquisition and registration of structural images (by means of light and scanning electron microscopes) to ensure the selective detection of carbides and carbide eutectics. In particular, the influence of accelerating voltage on the possibility of automating the detection process is analyzed. Very good results were obtained on images registered by applying very low accelerating voltages (0.5 to 1 kV)
Additional details
Identifiers
- DOI
- 10.1016/j.matchar.2005.11.015;
- PII
- S1044-5803(05)00268-8;
Publishing Information
- Journal Title
- Materials Characterization
- Journal Volume
- 56
- Journal Issue
- 4-5
- Journal Page Range
- p. 325-335
- ISSN
- 1044-5803
- CODEN
- MACHEX
Conference
- Title
- Stereology and image analysis in materials science
- Acronym
- 9th ECSIA and 7th STERMAT
- Dates
- 10-13 May 2005
- Place
- Zakopane (Poland)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38054438
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CARBIDES; COBALT; COBALT BASE ALLOYS; DETECTION; ELECTRIC POTENTIAL; ETCHING; EUTECTICS; HEAT RESISTING ALLOYS; IMAGES; SCANNING ELECTRON MICROSCOPY
- Descriptors DEC
- ALLOYS; CARBON COMPOUNDS; COBALT ALLOYS; ELECTRON MICROSCOPY; ELEMENTS; HEAT RESISTANT MATERIALS; MATERIALS; METALS; MICROSCOPY; SURFACE FINISHING; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.