Layer-to-layer analysis and electrical properties of niobium stannide vacuum condensates

Using the method of secondary ion mass-spectrometry the distribution of the main components and impurities in niobium stannide film thickness prepared in two ways the critical temperature Tsub(c) of superconducting transition, the R300/R20 electric resistance ratio, as well as the Q quality factor of film ring resonators on dielectric substrate are measured. The effect of the tin evaporation rate during joint Sn and Nb condensation on electrophysical properties and composition of the formed films is studied. While successive spraying Nb and Sn layers (or Sn-Cu alloy) with the following annealing of such a system in vacuum films are prepared with a nonuniform distribution of components in thickness, oxidated interfaces and low Q values