Published April 1, 2006 | Version v1
Journal article

Identification of divacancies in 4H-SiC

  • 1. Department of Physics, Chemistry and Biology, Linkoeping University, SE-581 83 Linkoeping (Sweden)
  • 2. Graduate School of Library, Information and Media Studies, RCKC, University of Tsukuba, Tsukuba 305-8550 (Japan)
  • 3. Department of Atomic Physics, Budapest University of Technology and Economics, Budafoki ut 8, H-1111 Budapest (Hungary)
  • 4. Lehrstuhl fuer Theoretische Festkoerperphysik, Unversitaet Erlangen-Nuernberg, Staudtstr. 7B2, D-91058 Erlangen (Germany)
  • 5. Norstel AB, Hans Meijers vaeg 2, SE-580 30 Linkoeping (Sweden)
  • 6. Japan Atomic Energy Research Institute, Takasaki 370-1292 (Japan)

Description

The P6/P7 centers in 4H-SiC were studied by electron paramagnetic resonance (EPR) and ab initio supercell calculations. The hyperfine coupling constants of C and Si neighbors obtained by EPR are in good agreement with the calculated values for the neutral divacancy, VCVSi0. Our results suggest that the P6/P7 centers, which were previously assigned to the photo-excited triplet states of the carbon vacancy-carbon antisite pairs in the double positive charge state (VCCSi2+), are related to the triplet ground states of the C3v/C1h configurations of VCVSi0

Additional details

Identifiers

DOI
10.1016/j.physb.2005.12.086;
PII
S0921-4526(05)01474-2;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
376-377
Journal Page Range
p. 334-337
ISSN
0921-4526
CODEN
PHYBE3

Conference

Title
23. international conference on defects in semiconductors
Dates
24-29 Jul 2005
Place
Awaji Island (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37073134
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CARBON; CHARGE STATES; COUPLING CONSTANTS; ELECTRON SPIN RESONANCE; GROUND STATES; SILICON CARBIDES; TRIPLETS; VACANCIES
Descriptors DEC
CARBIDES; CARBON COMPOUNDS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELEMENTS; ENERGY LEVELS; MAGNETIC RESONANCE; MULTIPLETS; NONMETALS; POINT DEFECTS; RESONANCE; SILICON COMPOUNDS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.