Published November 15, 1989
| Version v1
Journal article
Microstructure of superconducting YBa2Cu3O7-δ thin films on Si and alumina substrates with buffer layers
- 1. Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, Pennsylvania, 15213-3890 (USA)
Description
The microstructure of YBa2Cu3O7-δ (YBCO) films grown on silicon and alumina substrates with yttria-stabilized zirconia (YSZ) buffer layers has been studied by transmission electron microscopy (TEM) and x-ray diffraction. The as-deposited films are not amorphous, but are in fact composed of small crystalline grains. The top surface of the post-annealed YBCO film consists mainly of the orthorhombic structure of YBCO with large grains. Other phases are present within the films and have been identified. The presence of a very thin interdiffused layer of BaZrO3 between the YSZ and the YBCO has been shown by cross-sectional TEM
Additional details
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 66
- Journal Issue
- 10
- Series
- J. Appl. Phys.
- Journal Page Range
- 4886-4890
- ISSN
- 0021-8979
- CODEN
- JAPIA
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 21027053
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALUMINIUM OXIDES; BARIUM OXIDES; BUFFERS; COPPER OXIDES; ELECTRON DIFFRACTION; LAYERS; MICROSTRUCTURE; SILICON; SUBSTRATES; SUPERCONDUCTING FILMS; TRANSMISSION ELECTRON MICROSCO; YTTRIUM OXIDES
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; ALUMINIUM COMPOUNDS; BARIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; COPPER COMPOUNDS; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; FILMS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SEMIMETALS; TRANSITION ELEMENT COMPOUNDS; YTTRIUM COMPOUNDS