Pulsed laser deposition of doped skutterudite thin films
Creators
- 1. National Institute for Lasers, Plasma and Radiation Physics, P.O. Box MG-16, RO-77125 Magurele (Romania)
- 2. Laboratoire de Physique des Materiaux, UMR 7556, Ecole Nationale Superieure des Mines de Nancy, Parc de Saurupt, F-54042 Nancy (France)
Description
Ca xCo4Sb12 skutterudite thin films have been prepared by pulsed laser deposition using a Nd:YAG laser working at 532 or 266 nm of wavelength. Characterization has been carried out by X-ray diffraction, atomic force microscopy and scanning electron microscopy. Emphasis has been put on the difficulty to obtain the skutterudite phase. Influence of the deposition temperature, the way of sticking the substrate, the laser fluence, the base pressure prior to deposition and the laser wavelength has been studied. All parameters revealed to have a drastic effect, and the skutterudite could only be achieved in a very narrow range of temperature and laser fluence, for a given wavelength, showing the importance on how these parameters are measured to ensure reproducible results
Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2007.02.149;
- PII
- S0169-4332(07)00371-6;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 253
- Journal Issue
- 19
- Journal Page Range
- p. 8097-8101
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- Photon-assisted synthesis and processing of functional materials
- Acronym
- E-MRS-H Symposium
- Dates
- 29 May - 2 Jun 2006
- Place
- Nice (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39003204
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM OXIDES; ANTIMONY COMPOUNDS; ATOMIC FORCE MICROSCOPY; CALCIUM COMPOUNDS; COBALT COMPOUNDS; DOPED MATERIALS; ENERGY BEAM DEPOSITION; LASER RADIATION; PULSED IRRADIATION; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; ALUMINIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; FILMS; IRRADIATION; MATERIALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; SCATTERING; SURFACE COATING; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.