Published March 22, 1993
| Version v1
Journal article
Structural transitions of the CaF2/Si(111) interface
Creators
- 1. Center for Advanced Materials, Materials Sciences Division, Lawrence Berkeley Laboratory, University of California, Berkeley California 94720 (United States)
Description
We have used x-ray reflectivity and transmission electron microscopy to study the CaF2/Si(111) interface. The results are consistent with a reconstructed two-layer CaF interface which can be irreversibly transformed to a different structure simply by increasing the thickness of the CaF2 overlayer. We are able to reconcile previous measurements of the interface structure and gain insight into the rich variety of phenomena that may be observed at heteroepitaxial interfaces
Additional details
Publishing Information
- Journal Title
- Physical Review Letters
- Journal Volume
- 70
- Journal Issue
- 12
- Journal Page Range
- p. 1826-1829.
- ISSN
- 0031-9007
- CODEN
- PRLTAO
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 24049504
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CADMIUM FLUORIDES; CRYSTAL STRUCTURE; EPITAXY; HETEROJUNCTIONS; INTERFACES; MICROSTRUCTURE; PHASE TRANSFORMATIONS; REFLECTIVITY; SILICON; SYNCHROTRON RADIATION; TRANSMISSION ELECTRON MICROSCO; X-RAY SPECTROSCOPY
- Descriptors DEC
- BREMSSTRAHLUNG; CADMIUM COMPOUNDS; CADMIUM HALIDES; CRYSTAL GROWTH METHODS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; FLUORIDES; FLUORINE COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; MICROSCOPY; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; SEMICONDUCTOR JUNCTIONS; SEMIMETALS; SPECTROSCOPY; SURFACE PROPERTIES