Published February 2010 | Version v1
Journal article

Combined Rietveld refinement of Zn2SiO4:Mn2+ using X-ray and neutron powder diffraction data

  • 1. Korea Research Institute of Standards and Science, P.O. Box 102, Yuseong, Daejeon 305-340 (Korea, Republic of)
  • 2. Solid State Lighting and Energy Center, Materials Department, and Materials Research Laboratory, University of California, Santa Barbara, CA 93106 (United States)

Description

The behavior of Mn2+ ions doped into the crystal lattice of Zn2SiO4 is closely related to the luminescent properties of Zn2SiO4:Mn2+ as a color-emitting phosphor. The combined Rietveld refinement using X-ray and neutron powder diffraction was used to determine the site preference and the amount of Mn2+ ions in Zn2SiO4:Mn2+. Of possible cation-disorder models, the best Rietveld refinement was obtained from the model that Mn2+ ions partially substituted for Zn2+ ions in two crystallographically non-equivalent Zn sites. The final converged weighted R-factor, Rwp, and the goodness-of-fit indicator, S (=Rwp/Re) were 8.12% and 2.28, respectively. The occupancy of Mn2+ ions for the two non-equivalent Zn sites was 0.034(4) and 0.003(2), respectively. The refined model described the crystal structure in space group R-3 (No. 148) with Z = 18, a (=b) = 13.9612(1) A, c = 9.3294(1) A and γ = 120 deg.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2009.09.056

Additional details

Identifiers

DOI
10.1016/j.nimb.2009.09.056;
PII
S0168-583X(09)01045-3;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
268
Journal Issue
3-4
Journal Page Range
p. 346-351
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
X-ray techniques for advanced materials, nanostructures and thin films: From laboratory sources to synchrotron radiation
Acronym
EMRS 2009 spring meeting - Symposium R
Dates
8-12 Jun 2009
Place
Strasbourg (France)

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.