Deposition and patterning of Tl-Ca-Ba-Cu-O superconducting thin films
- 1. Cincinnati Univ., OH (United States). Dept. of Electrical and Computer Engineering
Description
This paper reports on high temperature superconducting Tl-Ca-Ba-Cu-O which were sputter deposited from a single composite powder target on SrTiO3 and LaAlO3 substrates, in an rf magnetron sputtering system. The as-deposited thin films were sintered and annealed in an excess Tl partial pressure to obtain superconductivity. The superconducting films were characterized by scanning electron microscope (SEM), x-ray diffraction (XRD) and resistance vs temperature (R vs T) measurements. Fine line features as small as 25 μm were obtained in as-deposited thin films using standard photolithography and wet chemical etching in a weak acid. From the XRD and SEM results, the annealed thin films were found to be highly c-axis oriented, with smooth platelets of 2-10 μm in size. The R vs T measurements showed zero resistance at temperatures as high as 107 K on SrTiO3 and 103 K on LaAlO3
Additional details
Publishing Information
- Publisher
- SPIE Society of Photo-Optical Instrumentation Engineers.
- Imprint Place
- Bellingham, WA (United States)
- ISBN
- 0-8194-0343-1
- Imprint Title
- Superconductivity applications for infrared and microwave devices
- Imprint Pagination
- 214 p.
- Journal Page Range
- p. 194-201.
Conference
- Title
- Superconductivity applications for infrared and microwave devices.
- Dates
- 16-20 Apr 1990.
- Place
- Orlando, FL (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23074400
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; CUPRATES; ELECTRIC IMPEDANCE; ETCHING; FABRICATION; HIGH-TC SUPERCONDUCTORS; MAGNETRONS; MEASURING METHODS; RF SYSTEMS; SCANNING ELECTRON MICROSCOPY; SPUTTERING; SUPERCONDUCTING FILMS; SUPERCONDUCTIVITY; TEMPERATURE MEASUREMENT; THALLIUM COMPOUNDS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; COPPER COMPOUNDS; DIFFRACTION; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; FILMS; HEAT TREATMENTS; IMPEDANCE; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; SUPERCONDUCTORS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Secondary number(s)
- CONF-9004105--.