Published May 1981 | Version v1
Report Metadata-only

Proton-induced X-ray emission (PIXE), a microanalytical method to determine element concentrations in thin sample materials

Creators

  • 1. Marburg Univ. (Germany, F.R.). Fachbereich Physik

Description

no abstract available

Additional details

Additional titles

Original title (German)
Die protoneninduzierte Roentgenemission (PIXE), eine mikroanalytische Methode zur Bestimmung von Elementgehalten duenner Probenmaterialien

Publishing Information

Imprint Title
Seminar on radionuclide technology
Imprint Pagination
45 p.
Journal Page Range
p. 41.
Report number
KFK-AFR--003

Conference

Title
Seminar on radionuclide technology.
Dates
13 - 15 May 1981.
Place
Karlsruhe, Germany, F.R.

INIS

Country of Publication
Germany
Country of Input or Organization
Germany
INIS RN
13658455
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference, No Abstract
Descriptors DEI
PROTON BEAMS; PROTON MICROPROBE ANALYSIS; REVIEWS; X-RAY EMISSION ANALYSIS
Descriptors DEC
BEAMS; CHEMICAL ANALYSIS; DOCUMENT TYPES; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; NUCLEON BEAMS; PARTICLE BEAMS

Optional Information

Notes
Published in summary form only. Imprint:Seminar Radionuklidtechnik.;Kurzfassungen der Vortraege.