Existence of ferromagnetism and structural characterization of nickel doped ZnO nanocrystals
Creators
- 1. PG and Research Department of Physics, Sri Paramakalyani College, Alwarkurichi, Tirunelveli, 627412, Tamil Nadu (India)
Description
Ni doped ZnO (Zn1-xNixO, in which 0.1 ≤ x ≤ 0.4) diluted magnetic semiconductor nanoparticles are prepared by microwave irradiated solvothermal process. The structural properties are studied using X-ray diffraction. It is evident from the XRD spectrum that the Ni doped ZnO nanocompounds exhibit single phase hexagonal wurtzite structure with strong c-axis orientation. To improve the crystalline quality the samples are annealed at 400 °C. The effects of annealing temperature and dopant concentration on the structural properties are also discussed. Unit cell expansion is clearly observed in Ni doped ZnO nanocrystals. The TEM images confirm that the particle size is 20 nm and the particles are well dispersed. The magnetic property of the nanocrystals was measured using vibrational sample magnetometer. According to the magnetization measurements ferromagnetic behavior was found in Zn0.9Ni0.1O combination. However, for the other higher dopant ratios paramagnetism is observed.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2012.04.021Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2012.04.021;
- PII
- S0169-4332(12)00663-0;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 258
- Journal Issue
- 18
- Journal Page Range
- p. 7161-7165
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44030820
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ANNEALING; CRYSTAL DEFECTS; DOPED MATERIALS; EXPANSION; FERROMAGNETISM; GRAIN SIZE; MAGNETIC PROPERTIES; MAGNETIC SEMICONDUCTORS; MAGNETIZATION; MAGNETOMETERS; MICROWAVE RADIATION; NANOSTRUCTURES; NICKEL ADDITIONS; PARAMAGNETISM; SPECTRA; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; ZINC OXIDES
- Descriptors DEC
- ALLOYS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; HEAT TREATMENTS; MAGNETISM; MATERIALS; MEASURING INSTRUMENTS; MICROSCOPY; MICROSTRUCTURE; NICKEL ALLOYS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SEMICONDUCTOR MATERIALS; SIZE; TRANSITION ELEMENT ALLOYS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.