Published 1973 | Version v1
Book

Applications of cryogenics in electron microscopy

  • 1. Univ. of Chicago

Description

Results of earlier work with superconducting lenses (objective lens excited with 27,220 ampere-turns) indicated some unique advantages inherent in systematic application of this approach in high resolution electron microscopy. Operating in the persistent current mode made possible resolutions of 10 to 20 A during longer exposure times at lower beam intensities, thus reducing specimen radiation damage. With the first prototype of a cryoelectron microscope system (i.e., large-scale, 20 W capacity, Collins closed-cycle superfluid helium refrigerator with 36-ft transfer lines and novel heat exchanger integrated with a modified 200 kV electron microscope), significantly reduced radiation damage, contamination and thermal noise are available in prolonged vibration-free examination of specimens at 1.8 to 4.20K. Simultaneously, the system provides high penetration power, ultra-high vacuums, decreased spherical and chromatic lens aberrations, and enhanced image contrast. Specially-adapted vacuum-tight microchambers have been used in studies of ice-crystal structure, wet membranes and new types of organometallic superconducting compounds. Consistent resolutions of 8 to 16 A are achieved, compared with corresponding low temperature resolutions of about 50 A one year ago. Descriptions of these instrumental developments are given together with results of their applications and implications in specific research areas, particularly membrane ultrastructure, cryobiology, microelectronics and general superconducting work. (U.S.)

Additional details

Publishing Information

Publisher
Scholium International, Inc.
Imprint Place
Whitestone, NY
Imprint Title
Applications of cryogenic technology. Vol. V
Imprint Pagination
p. 153-181.

Conference

Title
5. Annual conference of the Cryogenic Society of America.
Dates
3 Oct 1972.
Place
Chicago, Illinois, USA.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
7225347
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTROMAGNETIC LENSES; ELECTRON MICROSCOPY; SUPERCONDUCTING MAGNETS; ULTRAHIGH VACUUM; USES
Descriptors DEC
ELECTRICAL EQUIPMENT; ELECTROMAGNETS; LENSES; MAGNETS; MICROSCOPY

Optional Information

Notes
Imprint:See CONF-721023--.