Microstructural and chemical analysis performed by HRTEM and EDS on YBa2Cu3O7-x/Ag films irradiated with electrons

In this work, we have performed a high resolution transmission electron microscopy and chemical analyses by energy dispersive spectroscopy (EDS) on unirradiated and electron irradiated YBa2Cu3O7-x/Ag superconductor thick films and found that due to the preparation method, the following phases could coexist: YBa2Cu3O(7-x) (YBCO), YBa2Cu4O8 and YBa2Cu4O10-x. These results could be corroborated by the HRTEM analyses performed in several areas of the material. The analysis reveal that the Ag added to the material, is located mainly at the interface between the YBCO crystals. One very important aspect of the electron-irradiated samples, with which the samples were subject, is the creation of many defects scattered randomly through out the material. These defects, mainly as bending planes promote stacking faults and are presumably responsible of the enhancement of the inter grain density current, as supporting results reported previously