Effects of RF bias power on electron energy distribution function and plasma uniformity in inductively coupled argon plasma
Description
Changes in the plasma non-uniformity and the electron energy distribution function (EEDF) by increasing RF bias power were observed in inductively coupled plasma using spatially resolved radial EEDF measurements. As the bias power was increased at a fixed ICP power at a low gas pressure, The EEDF was evolved from a bi-Maxwellian to a Maxwellian distribution. The plasma density was decreased in all radial positions and thus plasma non-uniformity was slightly changed. However, strongly improved plasma spatial non-uniformity was observed at a high gas pressure with a decrease in the center-plasma density and an increase in the radial edge-plasma density. This result could be understood by combined effects of the ion acceleration loss and the non-uniform power deposition due to the RF bias power.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2011.01.218Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2011.01.218;
- PII
- S0040-6090(11)00277-X;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 519
- Journal Issue
- 20
- Journal Page Range
- p. 7009-7013
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 10. Asia-Pacific conference on plasma science and technology; SPSM 2010: 153. symposium on plasma science for materials
- Acronym
- APCPST 2010
- Dates
- 4-8 Jul 2010
- Place
- Jeju Island (Korea, Republic of)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43052060
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCELERATION; ARGON; AUGMENTATION; DEPOSITION; DISTRIBUTION; ELECTRONS; ENERGY SPECTRA; FUNCTIONS; PLASMA; PLASMA DENSITY
- Descriptors DEC
- ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; FLUIDS; GASES; LEPTONS; NONMETALS; RARE GASES; SPECTRA
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.