Published August 1, 2011 | Version v1
Journal article

Effects of RF bias power on electron energy distribution function and plasma uniformity in inductively coupled argon plasma

Description

Changes in the plasma non-uniformity and the electron energy distribution function (EEDF) by increasing RF bias power were observed in inductively coupled plasma using spatially resolved radial EEDF measurements. As the bias power was increased at a fixed ICP power at a low gas pressure, The EEDF was evolved from a bi-Maxwellian to a Maxwellian distribution. The plasma density was decreased in all radial positions and thus plasma non-uniformity was slightly changed. However, strongly improved plasma spatial non-uniformity was observed at a high gas pressure with a decrease in the center-plasma density and an increase in the radial edge-plasma density. This result could be understood by combined effects of the ion acceleration loss and the non-uniform power deposition due to the RF bias power.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2011.01.218

Additional details

Identifiers

DOI
10.1016/j.tsf.2011.01.218;
PII
S0040-6090(11)00277-X;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
519
Journal Issue
20
Journal Page Range
p. 7009-7013
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
10. Asia-Pacific conference on plasma science and technology; SPSM 2010: 153. symposium on plasma science for materials
Acronym
APCPST 2010
Dates
4-8 Jul 2010
Place
Jeju Island (Korea, Republic of)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43052060
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCELERATION; ARGON; AUGMENTATION; DEPOSITION; DISTRIBUTION; ELECTRONS; ENERGY SPECTRA; FUNCTIONS; PLASMA; PLASMA DENSITY
Descriptors DEC
ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; FLUIDS; GASES; LEPTONS; NONMETALS; RARE GASES; SPECTRA

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.