Flashover lithium ion source development
Description
The authors have found that water and hydrocarbon surface contaminants (adsorbates) contribute over one-half of the ion beam current extracted from an uncleaned lithium flashover source. They have developed methods to generate high purity (85%) lithium ion beams from these sources, either by vacuum baking combined with glow discharge cleaning, or by in-situ deposition of the ion source material. However, concurrent with this improvement, they have observed a significant decrease in the extracted ion current, from over 1.2KA/cm/sup 2/ from an epoxy source to less than 0.3KA/cm/sup 2/ from a cleaned lithium dielectric flashover source. The authors believe this high impedance diode behavior reflects the difficulty with which lithium is desorbed from an ionic lithium dielectric material compared to the easily desorbed adsorbates. This observation is supported by recent ESD and PSD studies which show that the vast majority of lithium is desorbed from LiF as ground state, neutral lithium via a slow thermal process (compared to the 40 ns diode power pulse). Several methods have been suggested to improve this situation
Additional details
Publishing Information
- Publisher
- IEEE Service Center.
- Imprint Place
- Piscataway, NJ (USA)
- Imprint Title
- Conference record of the 1986 IEEE international conference on plasma science
- Journal Page Range
- p. 33.
Conference
- Title
- 13. IEEE international conference on plasma science.
- Dates
- 19-21 May 1986.
- Place
- Saskatoon, Saskatchewan (Canada).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 18025449
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCELERATORS; BEAM CURRENTS; DIELECTRIC MATERIALS; FLASHOVER; ICF DEVICES; ION BEAMS; ION SOURCES; IONIZATION; LITHIUM IONS; PARTICLE BEAM FUSION ACCELERAT; PERFORMANCE TESTING; PLASMA DIAGNOSTICS; PULSE TECHNIQUES; SANDIA LABORATORIES; SPECIFICATIONS; THERMIONIC DIODES
- Descriptors DEC
- ATOMIC IONS; BEAMS; CHARGED PARTICLES; CURRENTS; DIODE TUBES; ELECTRIC DISCHARGES; ELECTRON TUBES; IONS; MATERIALS; NATIONAL ORGANIZATIONS; SANDIA NATIONAL LABORATORIES; TESTING; THERMIONIC TUBES; THERMONUCLEAR DEVICES; US AEC; US DOE; US ERDA; US ORGANIZATIONS