Published October 30, 2009 | Version v1
Journal article

Structure of ultrathin oxide layers on metal surfaces from grazing scattering of fast atoms

  • 1. Institut fuer Physik der Humboldt-Universitaet zu Berlin, Newtonstr. 15, D-12489 Berlin-Adlershof (Germany)

Description

The structure of ultrathin oxide layers grown on metal substrates is investigated by grazing scattering of fast atoms from the film surface. We present three recent experimental techniques which allow us to study the structure of ordered oxide films on metal substrates in detail. (1) A new variant of a triangulation method with fast atoms based on the detection of emitted electrons, (2) rainbow scattering under axial surface channeling conditions, and (3) fast atom diffraction (FAD) for studies on the structure of oxide films. Our examples demonstrate the attractive features of grazing fast atom scattering as a powerful analytical tool in surface physics.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2009.05.019

Additional details

Identifiers

DOI
10.1016/j.apsusc.2009.05.019;
PII
S0169-4332(09)00623-0;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
256
Journal Issue
2
Journal Page Range
p. 365-370
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
2. international conference on physics at surfaces and interfaces
Acronym
PSI2009
Dates
23-27 Feb 2009
Place
Puri (India)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44018204
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATOMS; CHANNELING; DETECTION; DIFFRACTION; ELECTRONS; FILMS; IONS; LAYERS; METALS; OXIDES; SCATTERING; SUBSTRATES; SURFACES; THIN FILMS
Descriptors DEC
CHALCOGENIDES; CHARGED PARTICLES; COHERENT SCATTERING; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; FILMS; LEPTONS; OXYGEN COMPOUNDS; SCATTERING

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.