Published October 30, 2009
| Version v1
Journal article
Structure of ultrathin oxide layers on metal surfaces from grazing scattering of fast atoms
- 1. Institut fuer Physik der Humboldt-Universitaet zu Berlin, Newtonstr. 15, D-12489 Berlin-Adlershof (Germany)
Description
The structure of ultrathin oxide layers grown on metal substrates is investigated by grazing scattering of fast atoms from the film surface. We present three recent experimental techniques which allow us to study the structure of ordered oxide films on metal substrates in detail. (1) A new variant of a triangulation method with fast atoms based on the detection of emitted electrons, (2) rainbow scattering under axial surface channeling conditions, and (3) fast atom diffraction (FAD) for studies on the structure of oxide films. Our examples demonstrate the attractive features of grazing fast atom scattering as a powerful analytical tool in surface physics.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2009.05.019Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2009.05.019;
- PII
- S0169-4332(09)00623-0;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 256
- Journal Issue
- 2
- Journal Page Range
- p. 365-370
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- 2. international conference on physics at surfaces and interfaces
- Acronym
- PSI2009
- Dates
- 23-27 Feb 2009
- Place
- Puri (India)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44018204
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMS; CHANNELING; DETECTION; DIFFRACTION; ELECTRONS; FILMS; IONS; LAYERS; METALS; OXIDES; SCATTERING; SUBSTRATES; SURFACES; THIN FILMS
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLES; COHERENT SCATTERING; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; FILMS; LEPTONS; OXYGEN COMPOUNDS; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.