Published June 1, 2005
| Version v1
Journal article
Comparison study of ITO thin films deposited by sputtering at room temperature onto polymer and glass substrates
Creators
- 1. Dep. Energias Renovables (CIEMAT), Avda. Complutense 22, Madrid-28040 (Spain)
Description
Indium tin oxide (ITO) thin films have been grown simultaneously onto glass and polymer substrates at room temperature by sputtering from ceramic target. The structure, morphology and electro-optical characteristics of the ITO/glass and ITO/polymer samples have been analyzed by X-ray diffraction, atomic force microscopy, four-point electrical measurements and spectrophotometry. In the selected experimental conditions, the polycrystalline ITO coating shows higher average grain size and higher conductivity, with similar visible transmittance, onto the polymer than onto the glass substrate
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2004.11.040;
- PII
- S0040-6090(04)01596-2;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 480-481
- Journal Page Range
- p. 129-132
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- Symposium O: Thin film chalcogenide photovoltaic materials
- Acronym
- E-MRS 2004 spring meeting
- Dates
- 24-28 May 2004
- Place
- Strasbourg (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37019482
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CERAMICS; COMPARATIVE EVALUATIONS; GLASS; GRAIN SIZE; INDIUM OXIDES; OPTICAL PROPERTIES; POLYMERS; SPECTROPHOTOMETRY; SPUTTERING; SUBSTRATES; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; TIN OXIDES; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; EVALUATION; FILMS; INDIUM COMPOUNDS; MICROSCOPY; MICROSTRUCTURE; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; SIZE; TEMPERATURE RANGE; TIN COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.