Twinning behavior of polycrystalline alpha-uranium under quasi static compression
- 1. Science and Technology on Surface Physics and Chemistry Laboratory, Jiangyou 621908, Sichuan (China)
- 2. Insititute of Materials, China Academy of Engineering Physics (CAEP), Jiangyou 621907, Sichuan (China)
Description
Deformation twins in cast uranium strained to 4.2% and 6.2% by quasi static compression were investigated using electron backscattered diffraction and transmission electron microscopy. Twin types of {130}, '{172}', {112} and '{176}' were observed in present experiment. All the operative twin variants in each twin type have the highest Schmid factor among the equivalent variants. Some {130} twins in cast uranium were inclined to disappear during subsequent loading through the re-twinning processes with Schmid factor values greater than 0.4. The '(−176)' variant was identified by indexing the electron diffraction pattern combining with the stereographic projection analysis. Twin pairs of '(−176)'–'(−17−2)' occurred in the adjacent grains were well matched with the geometric compatibility factor value of 0.933.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jnucmat.2016.05.041Additional details
Identifiers
- DOI
- 10.1016/j.jnucmat.2016.05.041;
- PII
- S0022-3115(16)30246-X;
Publishing Information
- Journal Title
- Journal of Nuclear Materials
- Journal Volume
- 478
- Journal Page Range
- p. 83-90
- ISSN
- 0022-3115
- CODEN
- JNUMAM
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48037262
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COMPRESSION; DEFORMATION; ELECTRON DIFFRACTION; ELECTRONS; GEOMETRY; POLYCRYSTALS; TRANSMISSION ELECTRON MICROSCOPY; TWINNING; URANIUM
- Descriptors DEC
- ACTINIDES; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; LEPTONS; MATHEMATICS; METALS; MICROSCOPY; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.