Computation of Grain-Noise Scattering Coefficients for Ultrasonic Pitch/Catch Inspections of Metals
Creators
- 1. Center for Nondestructive Evaluation, Iowa State University, Ames, IA 50011 (United States)
Description
One limiting factor in the detection of internal defects in metals is so-called 'grain noise' which arises from the scattering of sound by microstructural boundaries. For pulse/echo inspections, independent-scatterer models have been developed and applied successfully to predict backscattered grain noise characteristics in many situations of practical importance. Here we consider the extension of the independent-scatterer noise models to pitch-catch geometries. In this first of several planned papers, we focus on the evaluation of the scattering coefficient η which is a property of the microstructure alone and quantifies its capacity for generating grain noise. A general scheme for evaluating η is first laid out. Then, for simple single-phase cubic and hexagonal metals, formulas are developed which express η in terms of the single-crystal elastic constants and the mean grain diameter for various combinations of the incident and scattered wave types
Additional details
Identifiers
- DOI
- 10.1063/1.1916822;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 760
- Journal Issue
- 1
- Journal Page Range
- p. 1300-1307
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- Conference on review of progress in quantitative nondestructive evaluation
- Dates
- 25-30 Jul 2004
- Place
- Golden, CO (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36094946
- Subject category
- S42: ENGINEERING; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DEFECTS; DETECTION; EVALUATION; GEOMETRY; GRAIN BOUNDARIES; INSPECTION; METALS; MONOCRYSTALS; NOISE; PULSES; SCATTERING; SOUND WAVES; ULTRASONIC TESTING
- Descriptors DEC
- ACOUSTIC TESTING; CRYSTALS; ELEMENTS; MATERIALS TESTING; MATHEMATICS; MICROSTRUCTURE; NONDESTRUCTIVE TESTING; TESTING
Optional Information
- Notes
- (c) 2005 American Institute of Physics