Published April 9, 2005 | Version v1
Journal article

Computation of Grain-Noise Scattering Coefficients for Ultrasonic Pitch/Catch Inspections of Metals

  • 1. Center for Nondestructive Evaluation, Iowa State University, Ames, IA 50011 (United States)

Description

One limiting factor in the detection of internal defects in metals is so-called 'grain noise' which arises from the scattering of sound by microstructural boundaries. For pulse/echo inspections, independent-scatterer models have been developed and applied successfully to predict backscattered grain noise characteristics in many situations of practical importance. Here we consider the extension of the independent-scatterer noise models to pitch-catch geometries. In this first of several planned papers, we focus on the evaluation of the scattering coefficient η which is a property of the microstructure alone and quantifies its capacity for generating grain noise. A general scheme for evaluating η is first laid out. Then, for simple single-phase cubic and hexagonal metals, formulas are developed which express η in terms of the single-crystal elastic constants and the mean grain diameter for various combinations of the incident and scattered wave types

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
760
Journal Issue
1
Journal Page Range
p. 1300-1307
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
Conference on review of progress in quantitative nondestructive evaluation
Dates
25-30 Jul 2004
Place
Golden, CO (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36094946
Subject category
S42: ENGINEERING; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DEFECTS; DETECTION; EVALUATION; GEOMETRY; GRAIN BOUNDARIES; INSPECTION; METALS; MONOCRYSTALS; NOISE; PULSES; SCATTERING; SOUND WAVES; ULTRASONIC TESTING
Descriptors DEC
ACOUSTIC TESTING; CRYSTALS; ELEMENTS; MATERIALS TESTING; MATHEMATICS; MICROSTRUCTURE; NONDESTRUCTIVE TESTING; TESTING

Optional Information

Notes
(c) 2005 American Institute of Physics