Spin polarization in parallel double dots with spin-orbit interaction
Creators
- 1. College of Physical Science and Information Engineering, Hebei Normal University, Shijiazhuang, Hebei 050016 (China)
- 2. Hebei Advanced Thin Films Laboratory, Shijiazhuang, Hebei 050016 (China)
Description
Spin polarization in parallel double quantum dots embedded in arms of Aharonov-Bohm interferometer is investigated. The spin-orbit interaction exists in quantum dots. We find that the spin polarization is quite large even with a weak spin-orbit interaction. The direction and the strength of the spin polarization are well controllable and manipulatable by simply varying the strength of spin-orbit interaction or the energy levels in quantum dots. Moreover, electron-electron interaction strengthens the spin accumulation when the energy levels of the two quantum dots are identical. As the energy levels are unequal, electron-electron interaction cannot increase the spin accumulation. It is worth mentioning that the device is free of a magnetic field or a ferromagnetic material and it can be easily realized with present technology
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physleta.2008.09.049Additional details
Identifiers
- DOI
- 10.1016/j.physleta.2008.09.049;
- PII
- S0375-9601(08)01445-X;
Publishing Information
- Journal Title
- Physics Letters. A
- Journal Volume
- 372
- Journal Issue
- 45
- Journal Page Range
- p. 6790-6796
- ISSN
- 0375-9601
- CODEN
- PYLAAG
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40053306
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- AHARONOV-BOHM EFFECT; ELECTRON-ELECTRON INTERACTIONS; ENERGY LEVELS; FERROMAGNETIC MATERIALS; INTERFEROMETERS; L-S COUPLING; MAGNETIC FIELDS; QUANTUM DOTS; SPIN; SPIN ORIENTATION
- Descriptors DEC
- ANGULAR MOMENTUM; COUPLING; INTERACTIONS; INTERMEDIATE COUPLING; LEPTON-LEPTON INTERACTIONS; MAGNETIC MATERIALS; MATERIALS; MEASURING INSTRUMENTS; NANOSTRUCTURES; ORIENTATION; PARTICLE INTERACTIONS; PARTICLE PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.