Published 1988 | Version v1
Journal article Metadata-only

Large-area semiconductor probe for measuring exposure rates in radionuclide radiation sources and its calibration

Creators

  • 1. Ustav pro Vyzkum, Vyrobu a Vyuziti Radioisotopu, Prague (Czechoslovakia)
  • 2. CKD Praha, Prague (Czechoslovakia)
  • 3. Akademie der Wissenschaften der DDR, Leipzig (German Democratic Republic). Zentralinstitut fuer Isotopen- und Strahlenforschung

Description

The design and calibration are described of a large-area probe with semiconductor devices, used for exposure rate measurements in large radionuclide radiation sources, and its application potential is demonstrated. (author). 3 refs

Additional details

Additional titles

Original title (Czech)
Velkoplosna polovodicova sonda pro promerovani expozicnich prikonu v radionuklidovych radiacnich zdrojich a jeji kalibrace

Publishing Information

Journal Title
Radioisotopy
Journal Volume
29
Journal Issue
5-6
Series
Radioisotopy.
Journal Page Range
554-559
ISSN
0322-8657
CODEN
RAISB

Conference

Title
21. Brdicka days of radiation chemistry.
Original Conference Title
21. Brdickovy dny radiacni chemie
Dates
9-13 Nov 1987.
Place
Kuparovice (Czechoslovakia).

INIS

Country of Publication
Czech Republic
Country of Input or Organization
Serbia and Montenegro
INIS RN
21040588
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CALIBRATION; DOSE RATES; DOSIMETRY; RADIATION SOURCES; SILICON DIODES
Descriptors DEC
SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES

Optional Information

Notes
English translation available from Nuclear Information Center, 156 16 Prague 5-Zbraslav, Czechoslovakia at US$ 10 per page.