Published April 2013 | Version v1
Journal article

SRAM standby leakage decoupling analysis for different leakage reduction techniques

  • 1. State Key Laboratory of ASIC and System, Fudan University, Shanghai 201203 (China)

Description

SRAM standby leakage reduction plays a pivotal role in minimizing the power consumption of application processors. Generally, four kinds of techniques are often utilized for SRAM standby leakage reduction: Vdd lowering (VDDL), Vss rising (VSSR), BL floating (BLF) and reversing body bias (RBB). In this paper, we comprehensively analyze and compare the reduction effects of these techniques on different kinds of leakage. It is disclosed that the performance of these techniques depends on the leakage composition of the SRAM cell and temperature. This has been verified on a 65 nm SRAM test macro. (semiconductor integrated circuits)

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-4926/34/4/045008

Additional details

Publishing Information

Journal Title
Journal of Semiconductors
Journal Volume
34
Journal Issue
4
Journal Page Range
[5 p.]
ISSN
1674-4926

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44061291
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
COMPARATIVE EVALUATIONS; DECOUPLING; INTEGRATED CIRCUITS; LEAKS; PERFORMANCE; REDUCTION; SEMICONDUCTOR MATERIALS
Descriptors DEC
CHEMICAL REACTIONS; ELECTRONIC CIRCUITS; EVALUATION; MATERIALS; MICROELECTRONIC CIRCUITS