Published April 2013
| Version v1
Journal article
SRAM standby leakage decoupling analysis for different leakage reduction techniques
Creators
- 1. State Key Laboratory of ASIC and System, Fudan University, Shanghai 201203 (China)
Description
SRAM standby leakage reduction plays a pivotal role in minimizing the power consumption of application processors. Generally, four kinds of techniques are often utilized for SRAM standby leakage reduction: Vdd lowering (VDDL), Vss rising (VSSR), BL floating (BLF) and reversing body bias (RBB). In this paper, we comprehensively analyze and compare the reduction effects of these techniques on different kinds of leakage. It is disclosed that the performance of these techniques depends on the leakage composition of the SRAM cell and temperature. This has been verified on a 65 nm SRAM test macro. (semiconductor integrated circuits)
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-4926/34/4/045008Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Semiconductors
- Journal Volume
- 34
- Journal Issue
- 4
- Journal Page Range
- [5 p.]
- ISSN
- 1674-4926
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44061291
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- COMPARATIVE EVALUATIONS; DECOUPLING; INTEGRATED CIRCUITS; LEAKS; PERFORMANCE; REDUCTION; SEMICONDUCTOR MATERIALS
- Descriptors DEC
- CHEMICAL REACTIONS; ELECTRONIC CIRCUITS; EVALUATION; MATERIALS; MICROELECTRONIC CIRCUITS