Published May 2, 2011
| Version v1
Journal article
Synthesis of few-layered graphene by H2O2 plasma etching of graphite
- 1. Key Lab of Novel Thin Film Solar Cells, Institute of Plasma Physics, Chinese Academy of Sciences, P.O. Box 1126, Hefei 230031 (China)
Description
Herein, we reported an approach to synthesize few-layered graphene by etching of the graphite using H2O2 plasma technique. The synthesized few-layered graphene was characterized by scanning electron microscopy, atomic force microscopy, Raman spectroscopy, and x-ray photoelectron spectroscopy (XPS). The analysis showed that few-layered graphene was formed in high quality level. The XPS analysis suggested that H2O2 plasma etching of graphite could oxidize graphene and generated -C-OH and >C=O groups on the graphene surfaces. The H2O2 plasma technique is an easy and environmental friendly method to synthesize few-layered graphene from the graphite.
Additional details
Identifiers
- DOI
- 10.1063/1.3589354;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 98
- Journal Issue
- 18
- Journal Page Range
- p. 183114-183114.3
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42109071
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CARBON; ETCHING; GRAPHITE; HONEYCOMB STRUCTURES; HYDROGEN PEROXIDE; LAYERS; O GROUPS; RAMAN SPECTRA; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SPUTTERING; SURFACES; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CARBON; DYNAMICAL GROUPS; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; HYDROGEN COMPOUNDS; LASER SPECTROSCOPY; LIE GROUPS; MECHANICAL STRUCTURES; MICROSCOPY; MINERALS; NONMETALS; OXYGEN COMPOUNDS; PEROXIDES; PHOTOELECTRON SPECTROSCOPY; SPECTRA; SPECTROSCOPY; SURFACE FINISHING; SYMMETRY GROUPS
Optional Information
- Notes
- (c) 2011 American Institute of Physics