X-ray photoelectronic investigation of neutron irradiated pyrographite

Radiation defects in graphite are studied by the X-ray photoelectron spectroscopy method. The irradiated samples were annealed in a vacuum furnace during 2 hours to investigate the effect of annealing temperature on radiation defects. It is shown that the X-ray photoelectron spectrum of the C1s pyrographite electrons consists of the main line and not intensive supplementary line-satellite shifted relative to the main line to higher binding energies. The fluence increase leads to the C1s electrons line broadening and the annealing temperature increase narrows this line. The data obtained show that the pyrographite structure is completely restored at annealing temperature of 2000 deg C and its spectral characteristics of 2000 deg C and its spectral characteristics are in line with those standard pyrographite. The data are in good agreement with the data obtained by the X-ray diffraction analysis