Effect of C content on structure and the hardness of MoAlCN films
- 1. Hubei Key Laboratory of Digital Textile Equipment, Wuhan textile university, Wuhan 430073 (China)
Description
In this paper, Mo-Al-C-N films with different C content were deposited by magnetron sputtering. To investigate the effect of C content on the microstructure and hardness of Mo-Al-C-N films, surface morphology, composition, phase constituent and hardness of these films were characterized by field emission scan electron microscope, Energy Dispersive Spectroscopy, X-ray diffraction, Nanoindentor, respectively. Experiment results illustrate the diffraction peaks of Mo-Al-C-N films shift gradully toward lower angles due to the element C was dissolved into the Mo2N lattice by substituting N. The grain size decreases gradully from 35.8 to 16.7nm with the increase of C content in the range of 0−16at.% may be due to the amorphous CNx exited in the grain boundary. With increasing C content, the hardness of Mo-Al-C-N films increases firstly and reaches the maximum of 26 GPa at C content of 9 at.%, and then decreases to 21 GPa at C content 16 at.%. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1757-899X/612/2/022103Additional details
Identifiers
Publishing Information
- Journal Title
- IOP Conference Series. Materials Science and Engineering (Online)
- Journal Volume
- 612
- Journal Issue
- 2
- Journal Page Range
- [5 p.]
- ISSN
- 1757-899X
Conference
- Title
- 6. International Conference on Advanced Composite Materials and Manufacturing Engineering
- Dates
- 22-23 Jun 2019
- Place
- Yunnan (China)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52118188
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DEPOSITS; ELECTRON MICROSCOPES; EXPERIMENT RESULTS; FIELD EMISSION; GRAIN BOUNDARIES; GRAIN SIZE; HARDNESS; MAGNETRONS; MORPHOLOGY; SPECTROSCOPY; SURFACES; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EMISSION; EQUIPMENT; FILMS; MECHANICAL PROPERTIES; MICROSCOPES; MICROSTRUCTURE; MICROWAVE EQUIPMENT; MICROWAVE TUBES; SCATTERING; SIZE