Investigation of Cd1-xMnxTe crystals annealed in a Cd melt
- 1. State University of Moldova, Mateevici str. 60, MD 2009, Chisinau (Moldova, Republic of)
- 2. Gitsu Institute of Electronic Engineering and Nanotechnologies, Academy of Sciences of Moldova, Academiei str. 3/3, MD-2028, Chisinau (Moldova, Republic of)
Description
Cd1-xMnxTe crystals are among the most efficient, from the practical point of view, semimagnetic semiconductors, which could be used in optoelectronic and magneto-optic devices. However, their using is limited by such factors as high concentration of inherited point-like defects and uncontrolled impurities, non-uniform distribution of the dissolved substance, presence of the inclusions of the second phase, mechanical stress, etc. The presence of these defects, first of all, is stipulated by the technological conditions of material fabrication. To decrease the number of defects, the annealing in the vapor or melt of components is carried out. In the given paper, the results of the investigation of the galvano-magnetic properties of Cd1-xMnxTe crystals annealed in a medium of cadmium are described. (authors)
Availability note (English)
Available online at http://sfm.asm.md/moldphys/Additional details
Identifiers
Publishing Information
- Journal Title
- Moldavian Journal of the Physical Sciences
- Journal Volume
- 10
- Journal Issue
- 2
- Journal Page Range
- p. 182-185
- ISSN
- 1810-648X
INIS
- Country of Publication
- Moldova, Republic of
- Country of Input or Organization
- Moldova, Republic of
- INIS RN
- 43053883
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; CADMIUM COMPOUNDS; CHARGE CARRIERS; CRYSTALS; ELECTRIC CONDUCTIVITY; MAGNETIC PROPERTIES; MANGANESE COMPOUNDS; SEMICONDUCTOR MATERIALS; TELLURIDES; TELLURIUM COMPOUNDS; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0400-1000 K
- Descriptors DEC
- CHALCOGENIDES; ELECTRICAL PROPERTIES; HEAT TREATMENTS; MATERIALS; PHYSICAL PROPERTIES; TELLURIUM COMPOUNDS; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- 5 refs., 4 figs.