Published 2005
| Version v1
Journal article
Structural and electronic properties of In, Sn and Sb ultra thin films growth on Pd(111), studied by using Photoelectron Diffraction (PED) and X-ray Photoelectron Spectroscopy (XPS)
Description
no abstract available
Additional details
Additional titles
- Original title (Portuguese)
- Propriedades estruturais e eletronicas de filmes ultra finos de In, Sn e Sb crescidos sobre Pd(111), estudados por PED e XPS
Publishing Information
- Journal Title
- Physicae
- Journal Issue
- 5
- Journal Page Range
- p. 63
- ISSN
- 1679-9569
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 38037665
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract, Thesis
- Descriptors DEI
- ANTIMONY; ELECTRONIC STRUCTURE; FILMS; INDIUM; MOLECULAR STRUCTURE; PALLADIUM; PALLADIUM ARSENIDES; PHOTOELECTRON SPECTROSCOPY; THIN FILM STORAGE DEVICES; THIN FILMS; TIN; TIN ARSENIDES; X RADIATION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; IONIZING RADIATIONS; MEMORY DEVICES; METALS; PALLADIUM COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PLATINUM METALS; PNICTIDES; RADIATIONS; SPECTROSCOPY; TIN COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS