Influence of moving tape speed on continuous deposition of buffer layers for long-length YBCO coated conductors

This paper reports our activity for development of Y2O3 buffer layer on rolled NiW substrates using continuous electron beam evaporation and magnetron sputtering technique. X-ray diffraction of θ-2θ scan and φ-scan were employed to characterize the in-plane alignment and cube texture. The surface morphology of buffer layers was evaluated in SEM. We study the effect of moving speed of NiW substrates on continuous preparation of buffer layer and two deposition techniques were compared in detail. Results show that textured, crack-free buffer layers were obtained and two techniques are promising for developing long-length YBCO tape