Published February 21, 2004 | Version v1
Journal article

Outline of an ultracorrector compensating for all primary chromatic and geometrical aberrations of charged-particle lenses

Creators

Description

A novel ultracorrector is outlined which compensates for the primary and secondary first-order chromatic aberrations and all third-order geometrical aberrations of electron optical systems with a straight axis. Owing to the imposed symmetry conditions on the fields and the paraxial fundamental rays, the corrector does not introduce aberrations with 2-fold symmetry. The chromatic aberrations are corrected by means of crossed electric magnetic quadrupoles while the third-order geometrical aberrations are eliminated by octopoles. By placing these elements at distinct positions within the corrector, it is possible to successively eliminate the third-order aberrations in such a way that each subsequent correction does not affect the aberrations corrected in the preceding correction steps

Additional details

Identifiers

DOI
10.1016/j.nima.2003.11.115;
PII
S0168900203029899;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
519
Journal Issue
1-2
Journal Page Range
p. 12-27
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
6. international conference on charged particle optics
Dates
21-25 Oct 2002
Place
Greenbelt, MD (United States)

INIS

Country of Publication
Netherlands
Country of Input or Organization
Mexico
INIS RN
35077859
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHARGED PARTICLES; CHROMATIC ABERRATIONS; CORRECTIONS; DIAGRAMS; EIKONAL APPROXIMATION; ELECTRONS; GEOMETRICAL ABERRATIONS; LENSES; OCTUPOLES; OPTICAL SYSTEMS; QUADRUPOLES; SYMMETRY
Descriptors DEC
ELEMENTARY PARTICLES; FERMIONS; INFORMATION; LEPTONS; MULTIPOLES

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.