Outline of an ultracorrector compensating for all primary chromatic and geometrical aberrations of charged-particle lenses
Creators
Description
A novel ultracorrector is outlined which compensates for the primary and secondary first-order chromatic aberrations and all third-order geometrical aberrations of electron optical systems with a straight axis. Owing to the imposed symmetry conditions on the fields and the paraxial fundamental rays, the corrector does not introduce aberrations with 2-fold symmetry. The chromatic aberrations are corrected by means of crossed electric magnetic quadrupoles while the third-order geometrical aberrations are eliminated by octopoles. By placing these elements at distinct positions within the corrector, it is possible to successively eliminate the third-order aberrations in such a way that each subsequent correction does not affect the aberrations corrected in the preceding correction steps
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2003.11.115;
- PII
- S0168900203029899;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 519
- Journal Issue
- 1-2
- Journal Page Range
- p. 12-27
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 6. international conference on charged particle optics
- Dates
- 21-25 Oct 2002
- Place
- Greenbelt, MD (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Mexico
- INIS RN
- 35077859
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGED PARTICLES; CHROMATIC ABERRATIONS; CORRECTIONS; DIAGRAMS; EIKONAL APPROXIMATION; ELECTRONS; GEOMETRICAL ABERRATIONS; LENSES; OCTUPOLES; OPTICAL SYSTEMS; QUADRUPOLES; SYMMETRY
- Descriptors DEC
- ELEMENTARY PARTICLES; FERMIONS; INFORMATION; LEPTONS; MULTIPOLES
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.