Published 1970 | Version v1
Book Metadata-only

Weak beam investigations of small defect clusters in metals

Creators

  • 1. Max-Planck-Institut fuer Metallforschung, Stuttgart (F.R. Germany)

Description

no abstract available

Additional details

Additional titles

Original title (no language)
Microscopie electronique 1970.

Publishing Information

Publisher
Societe Francaise de Microscopie Electronique.
Imprint Place
Paris, France
Imprint Title
Electron microscopy 1970
Imprint Pagination
p. 225-226.

Conference

Title
7. International congress for electron microscopy.
Dates
30 Aug 1970.
Place
Grenoble, France.

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
2011623
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference, Progress Report
Descriptors DEI
DEFECTS; ELECTRIC POTENTIAL; ELECTRON MICROSCOPY; METALS; RADIATION EFFECTS

Optional Information

Notes
Abstract only. Imprint:Microscopie electronique 1970.;Vol.2. Physique.