Published March 15, 2015 | Version v1
Journal article

Influence of phase transformation on interfacial activity and bend sensitivity of rapidly quenched Fe77.5Si7.5B15/Co72.5Si12.5B15 bilayered magnetostrictive ribbons

Description

Rapidly quenched bilayer magnetostrictive ribbons have been prepared and characterized to investigate phase transformations, interfacial activity and their potentiality as bend sensors. The bilayer ribbons were processed in a way to make the positively magnetostrictive layer Fe77.5Si7.5B15 as the free surface while negatively magnetostrictive Co72.5Si12.5B15 layer as the one in contact with the quenching copper wheel. Elemental concentration profiles obtained through electron probe microanalysis (EPMA) revealed synergistic variation in Fe and Co content at the interface. Devitrification process was also observed from atomic migrations and combinations influencing the interface width. Configuration of the bent layers showed interesting bending parameter output which could be further enhanced through stress relaxation. A detrimental effect of devitrification on bend sensitivity of rapidly quenched bilayers was also displayed. - Highlights: • Melt spun bilayered ribbons of Fe77.5Si7.5B15 and Co72.5Si12.5B15 alloys were prepared. • Superior bend sensitivity in bilayered ribbons were observed through stress relief. • Synergistic Fe and Co interfacial diffusion occurred across Fe and Co alloy bilayer. • Quantitative analysis elucidates diffusion across interface zone of bilayer. • Bend sensor configuration has been suggested based on functional gradation

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jmmm.2014.11.077

Additional details

Identifiers

DOI
10.1016/j.jmmm.2014.11.077;
PII
S0304-8853(14)01196-2;

Publishing Information

Journal Title
Journal of Magnetism and Magnetic Materials
Journal Volume
378
Journal Page Range
p. 440-446
ISSN
0304-8853
CODEN
JMMMDC

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.