Phase transformations of crystalline SiO2 versus dynamic disorder between room temperature and liquid state
- 1. CNRS, CEMHTI UPR3079, University of Orléans, F-45071 Orléans (France)
Description
The sequence of phase transitions of crystalline silica has been probed by infrared emission spectroscopy. The lattice dynamics, deeply impacted by the low frequency dynamic disorder, exhibit with increasing temperature signs of inhomogeneous broadening of the symmetry-allowed normal modes. High frequency supplementary components are also activated. The analysis with a causal Voigt dielectric function model within the framework of hard mode spectroscopy allowed a fine characterization of solid–solid phase transitions. We also report experimental evidence showing that the occurrence of the intermediate ill-defined region above 1300 K is concomitant with the reactivation of the low frequency dynamic disorder; a behavior change that on the way explains the appearance of the negative thermal expansion regime. (papers)
Availability note (English)
Available from http://dx.doi.org/10.1088/0953-8984/26/25/255402Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Condensed Matter
- Journal Volume
- 26
- Journal Issue
- 25
- Journal Page Range
- [11 p.]
- ISSN
- 0953-8984
- CODEN
- JCOMEL
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46036353
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- DIELECTRIC MATERIALS; EMISSION SPECTROSCOPY; LIQUIDS; PHASE TRANSFORMATIONS; SILICA; SILICON OXIDES; SOLIDS; TEMPERATURE RANGE 0273-0400 K; THERMAL EXPANSION
- Descriptors DEC
- CHALCOGENIDES; EXPANSION; FLUIDS; MATERIALS; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; SILICON COMPOUNDS; SPECTROSCOPY; TEMPERATURE RANGE