Efficient generation of single and entangled photons on a silicon photonic integrated chip
Creators
- 1. Department of Electrical Engineering, Columbia University, New York, New York 10027 (United States)
- 2. Department of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027 (United States)
Description
We present a protocol for generating on-demand, indistinguishable single photons on a silicon photonic integrated chip. The source is a time-multiplexed spontaneous parametric down-conversion element that allows optimization of single-photon versus multiphoton emission while realizing high output rate and indistinguishability. We minimize both the scaling of active elements and the scaling of active element loss with multiplexing. We then discuss detection strategies and data processing to further optimize the procedure. We simulate an improvement in single-photon-generation efficiency over previous time-multiplexing protocols, assuming existing fabrication capabilities. We then apply this system to generate heralded Bell states. The generation efficiency of both nonclassical states could be increased substantially with improved fabrication procedures.
Additional details
Identifiers
- DOI
- 10.1103/PhysRevA.84.052326;
- arXiv
- arXiv:1110.3936v1;
Publishing Information
- Journal Title
- Physical Review. A
- Journal Volume
- 84
- Journal Issue
- 5
- Journal Page Range
- p. 052326-052326.7
- ISSN
- 1050-2947
- CODEN
- PLRAAN
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44051899
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- BELL THEOREM; CONVERSION; DATA PROCESSING; EFFICIENCY; FABRICATION; MULTI-PHOTON PROCESSES; OPTIMIZATION; PHOTON EMISSION; PHOTONS; QUANTUM ENTANGLEMENT; QUANTUM MECHANICS; QUANTUM STATES; SILICON
- Descriptors DEC
- BOSONS; ELEMENTARY PARTICLES; ELEMENTS; EMISSION; MASSLESS PARTICLES; MECHANICS; PROCESSING; SEMIMETALS
Optional Information
- Notes
- (c) 2011 American Institute of Physics