Effect of sulfurization time on the performance of monoclinic Cu2SnS3 solar cells
Creators
- 1. School of Chemical Engineering, Yeungnam University, Gyeongsan 38541 (Korea, Republic of)
- 2. Department of Physics, Kyungpook National University, 80 Daehakro, Bukgu, Daegu 41566 (Korea, Republic of)
Description
In this study, monoclinic (M)-Cu2SnS3 (CTS) thin films were prepared by high vacuum (10 Pa) rapid thermal sulfurization of sputtered Cu/Sn/Cu metallic layers. The effect of sulfurization time (1 min, 5 min, 10 min, and 20 min) on the crystal structure, morphology, optical studies, and electrical studies of the M-CTS thin films was investigated. The structural studies assessed the formation of M-CTS single phase for the films sulfurized ≥10 min and the secondary phases in addition to M-CTS at shorter sulfurization durations of ≤5 min. The single phase M-CTS films sulfurized at 10 min showed dense morphology and had a band gap energy of 0.92 eV. The present results indicated that the short sulfurization time of 10 min is sufficient for the formation of single phase M-CTS thin films. The fabricated M-CTS solar cell showed a PCE of 0.51% for the films sulfurized at 10 min.
Additional details
Identifiers
- DOI
- 10.1016/j.solener.2019.06.004;
- PII
- S0038092X19305687;
Publishing Information
- Journal Title
- Solar Energy
- Journal Volume
- 188
- Journal Page Range
- p. 209-217
- ISSN
- 0038-092X
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55104575
- Subject category
- S14: SOLAR ENERGY;
- Descriptors DEI
- COMPUTERIZED TOMOGRAPHY; LAYERS; MONOCLINIC LATTICES; MORPHOLOGY; PERFORMANCE; SOLAR CELLS; SPUTTERING; THIN FILMS
- Descriptors DEC
- CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIAGNOSTIC TECHNIQUES; DIRECT ENERGY CONVERTERS; EQUIPMENT; FILMS; PHOTOELECTRIC CELLS; PHOTOVOLTAIC CELLS; SOLAR EQUIPMENT; THREE-DIMENSIONAL LATTICES; TOMOGRAPHY
Optional Information
- Copyright
- Copyright (c) 2019 International Solar Energy Society. Published by Elsevier Ltd. All rights reserved.