Time of flight spectra of electrons emitted from graphite after positron annihilation
Creators
- 1. Dept. of Physics, University of Texas at Arlington. Arlington, Texas 76019 (United States)
Description
Low energy (∼2 eV) positrons were deposited onto the surface of highly oriented pyrolytic graphite (HOPG) using a positron beam equipped with a time of flight (TOF) spectrometer. The energy of the electrons emitted as a result of various secondary processes due to positron annihilation was measured using the University of Texas at Arlington's (UTA) TOF spectrometer. The positron annihilation-induced electron spectra show the presence of a carbon KLL Auger peak at ∼263 eV. The use of a very low energy beam allowed us to observe a new feature not previously seen: a broad peak which reached to a maximum intensity at ∼4 eV and extended up to a maximum energy of ∼15 eV. The low energy nature of the peak was confirmed by the finding that the peak was eliminated when a tube in front of the sample was biased at -15 V. The determination that the electrons in the peak are leaving the surface with energies up to 7 times the incoming positron energy indicates that the electrons under the broad peak were emitted as a result of a positron annihilation related process. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/791/1/012031Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 791
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- 14. international workshop on slow positron beam techniques and applications
- Dates
- 22-27 May 2016
- Place
- Matsue (Japan)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49017616
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNIHILATION; AUGER ELECTRON SPECTROSCOPY; ELECTRON EMISSION; ELECTRON SPECTRA; ELECTRONS; EMISSION; GRAPHITE; POSITRON BEAMS; POSITRONS; SURFACES; TIME-OF-FLIGHT METHOD
- Descriptors DEC
- ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; BEAMS; CARBON; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; ELEMENTS; EMISSION; FERMIONS; INTERACTIONS; LEPTON BEAMS; LEPTONS; MATTER; MINERALS; NONMETALS; PARTICLE BEAMS; PARTICLE INTERACTIONS; SPECTRA; SPECTROSCOPY