Thermal fluctuations in antiferromagnetic nanostructures

A theoretical model is developed that can accurately analyze the effects of thermal fluctuations in antiferromagnetic (AFM) nano-particles. The approach is based on Fourier series representation of the random effective field with cut-off frequencies of physical origin at low and high limits while satisfying the fluctuation-dissipation theorem at the same time. When coupled with the formalism of a Langevin dynamical equation, it can describe the stochastic Néel vector dynamics with the AFM parameters, circumventing the arbitrariness of the commonly used treatments in the micro-magnetic simulations. Subsequent application of the model to spontaneous Néel vector switching provides a thermal stability analysis of the AFM states. The numerical simulation shows that the AFM states are much less prone to the thermally induced accidental flips than the ferromagnetic counterparts, suggesting a longer retention time for the former.