Published 1989 | Version v1
Book

Enhancement of the reflectivity of multilayer x-ray mirrors by ion polishing

Creators

  • 1. IBM Research Div., T.J. Watson Research Center, Yorktown Heights, NY (United States)

Description

This paper reports on the performance of multilayer x-ray mirrors which is improved by smoothing the boundaries within the multilayer stack with ion bombardment at grazing angles of incidence. The process is applied to Co-C and to RhRu-C mirrors for normal incidence telescopes at λ = 64 and λ = 114 Angstrom and the reflectivity is increased by a factor of two in both cases. Accumulation of roughness during deposition is eliminated

Additional details

Publishing Information

Publisher
SPIE Society of Photo-Optical Instrumentation Engineers.
Imprint Place
Bellingham, WA (United States)
Imprint Title
X-ray/EUV optics for astronomy and microscopy
Imprint Pagination
670 p.
Journal Page Range
p. 270-279.

Conference

Title
33. SPIE annual international technical symposium on optical and optoelectronic applied science and engineering.
Dates
6-11 Aug 1989.
Place
San Diego, CA (United States).

Optional Information

Secondary number(s)
CONF-890836--.