An improved multiple-image radiography method extracting refraction information in analyzer-based imaging
Description
Analyzer-based imaging is one of X-ray phase-contrast imaging techniques, which generate improved contrast compared to the conventional absorption radiography. The refraction images of an investigated object can be yielded using a given number of raw images measured at different positions of analyzer crystal along its rocking curve. When applying the multiple-image radiography (MIR) method to retrieve the refraction-angles, the calculated values always underestimate the actual ones (particularly for high refraction angles). An improved method of MIR is proposed and developed in this paper. The computer simulation experiment is performed to draw comparison of the proposed method and the original MIR method. The findings suggest that under the same sampling condition, the proposed method can produce more accurate refraction images. Besides, the difference of computation time between them can be negligible. The proposed method may be useful in practical application of extracting refraction images as a valid alternative to the original MIR method
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2014.10.035Additional details
Identifiers
- DOI
- 10.1016/j.nima.2014.10.035;
- PII
- S0168-9002(14)01183-8;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 770
- Journal Page Range
- p. 182-188
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46125483
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ABSORPTION; CALCULATION METHODS; COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; CRYSTALS; EXTRACTION; IMAGE PROCESSING; IMAGES; NEUTRON DIFFRACTION; REFRACTION; SAMPLING; X RADIATION; X-RAY RADIOGRAPHY
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; EVALUATION; INDUSTRIAL RADIOGRAPHY; IONIZING RADIATIONS; MATERIALS TESTING; NONDESTRUCTIVE TESTING; PROCESSING; RADIATIONS; SCATTERING; SEPARATION PROCESSES; SIMULATION; SORPTION; TESTING
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.