Published December 2020 | Version v1
Journal article Metadata-only

In-situ study on structure dependent quantized conductance uncovered via electron crystallography

Creators

  • 1. Professor Emeritus, Tokyo Institute of Technology, Tokyo (Japan)

Description

Efforts and contributions of "surface" electron diffraction and microscopy have revealed "structure reconstruction" at clean surfaces and interfaces, which evolves during adsorption, deposition and annealing processes. Emphasis is the development of "in-situ" UHV electron microscopy with STM, which uncovers the quantum conductance of gold nanowires formed between the electrodes. (author)

Availability note (English)

Available from DOI: https://doi.org/10.5940/jcrsj.62.226

Additional details

Additional titles

Original title (Japanese)
電子線結晶学による表面ナノ構造と量子伝導性との同時観測に関する研究

Identifiers

DOI
10.5940/jcrsj.62.226;

Publishing Information

Journal Title
Nippon Kessho Gakkai-Shi (Online)
Journal Volume
62
Journal Issue
4
Series
雑誌名:日本結晶学会誌
Journal Page Range
p. 226-233
ISSN
1884-5576

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
52100658
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
COINCIDENCE METHODS; CRYSTALLOGRAPHY; DISLOCATIONS; ELECTRIC CONDUCTIVITY; ELECTRON DIFFRACTION; EPITAXY; LATTICE PARAMETERS; NANOWIRES; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR MATERIALS; TRANSMISSION ELECTRON MICROSCOPY; VOLTAMETRY; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; COUNTING TECHNIQUES; CRYSTAL DEFECTS; CRYSTAL GROWTH METHODS; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; LINE DEFECTS; MATERIALS; MICROSCOPY; NANOSTRUCTURES; PHYSICAL PROPERTIES; SCATTERING

Optional Information

Notes
94 refs., 9 figs.