Published February 11, 2011
| Version v1
Journal article
A novel HPGe detector for gamma-ray tracking and imaging
- 1. Joint Institute for Heavy Ion Research, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6371 (United States)
- 2. Physics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6371 (United States)
- 3. Global Nuclear Security Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 38931-6010 (United States)
Description
A novel, large-volume High Purity Germanium (HPGe) detector that will provide gamma-ray detection with both sub-mm position resolution and high efficiency is under development. This design is based on a coaxial HPGe geometry and employs a point contact along with segmentation of the outer electrode. Calculations indicate that this device will be capable of achieving values of position sensitivity which are approximately a factor of four or five greater than conventional gamma-ray tracking detectors.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2011.10.008Additional details
Identifiers
- DOI
- 10.1016/j.nima.2011.10.008;
- PII
- S0168-9002(11)01898-5;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 665
- Journal Page Range
- p. 25-32
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44010718
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- DESIGN; EFFICIENCY; ELECTRIC CONTACTS; ELECTRODES; GAMMA DETECTION; GAMMA RADIATION; HIGH-PURITY GE DETECTORS; IMPURITIES; RESOLUTION; SENSITIVITY
- Descriptors DEC
- DETECTION; ELECTRICAL EQUIPMENT; ELECTROMAGNETIC RADIATION; EQUIPMENT; GE SEMICONDUCTOR DETECTORS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.