Published February 1995
| Version v1
Journal article
Analysis of dislocation structure inhomogeneity by the X-ray line width
Creators
- 1. Moscow Institute of Steel and Alloys (Russian Federation)
Description
X-ray scattering from polycrystals with nonuniformly deformed microstructural components has been studied in the kinematic approximation. The results obtained lend support to the possibility of using conventional techniques for determining the average dislocation density for cases where the dislocation density in the phase grains varies within one or two orders of magnitude. An experimental criterion for structural inhomogeneity is suggested and quantitative evaluation of the parameters of structural inhomogeneity is discussed
Additional details
Publishing Information
- Journal Title
- Industrial Laboratory
- Journal Volume
- 60
- Journal Issue
- 8
- Journal Page Range
- p. 481-483.
- ISSN
- 0019-8447
- CODEN
- INDLAP
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 28011466
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Translation
- Descriptors DEI
- DISLOCATIONS; LINE WIDTHS; MICROSTRUCTURE; POLYCRYSTALS; X-RAY DIFFRACTOMETERS
- Descriptors DEC
- CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTOMETERS; LINE DEFECTS; MEASURING INSTRUMENTS
Optional Information
- Notes
- Cover-to-cover Translation of Zavodskaya Laboratoriya (USSR); Translated from Zavodskaya Laboratoriya; 60: No. 8, 36-38(Aug 1994).