Published February 1995 | Version v1
Journal article

Analysis of dislocation structure inhomogeneity by the X-ray line width

  • 1. Moscow Institute of Steel and Alloys (Russian Federation)

Description

X-ray scattering from polycrystals with nonuniformly deformed microstructural components has been studied in the kinematic approximation. The results obtained lend support to the possibility of using conventional techniques for determining the average dislocation density for cases where the dislocation density in the phase grains varies within one or two orders of magnitude. An experimental criterion for structural inhomogeneity is suggested and quantitative evaluation of the parameters of structural inhomogeneity is discussed

Additional details

Publishing Information

Journal Title
Industrial Laboratory
Journal Volume
60
Journal Issue
8
Journal Page Range
p. 481-483.
ISSN
0019-8447
CODEN
INDLAP

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
28011466
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Translation
Descriptors DEI
DISLOCATIONS; LINE WIDTHS; MICROSTRUCTURE; POLYCRYSTALS; X-RAY DIFFRACTOMETERS
Descriptors DEC
CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTOMETERS; LINE DEFECTS; MEASURING INSTRUMENTS

Optional Information

Notes
Cover-to-cover Translation of Zavodskaya Laboratoriya (USSR); Translated from Zavodskaya Laboratoriya; 60: No. 8, 36-38(Aug 1994).