A new concept for a cryogenic amplifier stage
- 1. Max-Planck Institute of Extraterrestrial Physics, Giessenbachstrasse, 85740 Garching (Germany)
- 2. Semiconductor Laboratory of the Max-Planck Institutes, Otto-Hahn-Ring 6, 81739 Muenchen (Germany)
- 3. PNSensor GmbH, Roemerstrasse 28, 80803 Muenchen (Germany)
- 4. Max-Planck Institute of Physics, Foehringer Ring 6, 80805 Muenchen (Germany)
Description
The observation of astrophysical objects in the mid-infrared requires Blocked Impurity Band (BIB) detectors based on n-doped Silicon. It is desirable to observe faint astronomical objects with such a detector, which can be achieved with a high signal to noise ratio. These detectors operate at a temperature range from 6 to 12 K. We foresee a new detector concept for the readout of the generated signal charge. Our aim is to implement a Depleted P-channel Field Effect Transistor (DEPFET) Active Pixel Sensor (APS) on the BIB detector in order to have a high sensitivity. We successfully operated the DEPFET under cryogenic conditions and investigated the reset mechanism of the collected signal charge. We identified uncomplete clear with freeze-out of the signal charge into ionized shallow donor states in the heavily doped internal Gate of the DEPFET due to low thermal energy. Therefore, we found a solution to emit these localized signal charges into the conduction band in order to ensure the transport from the internal Gate to the Clear contact. It is possible to apply electric fields higher than 17kV/cm at the position of the collected signal charge to emit the electrons from the shallow donor states. The electric field enhanced emission is equivalent to the tunneling effect.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2010.03.122Additional details
Identifiers
- DOI
- 10.1016/j.nima.2010.03.122;
- PII
- S0168-9002(10)00705-9;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 624
- Journal Issue
- 2
- Journal Page Range
- p. 476-481
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 11. european symposium on semiconductor detectors
- Dates
- 7-11 Jun 2009
- Place
- Wildbad Kreuth (Germany)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42074965
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMPLIFIERS; ASTROPHYSICS; DOPED MATERIALS; ELECTRIC FIELDS; ELECTRONIC STRUCTURE; ELECTRONS; EMISSION; FIELD EFFECT TRANSISTORS; FREEZING OUT; IMPURITIES; INFRARED SPECTRA; N-TYPE CONDUCTORS; READOUT SYSTEMS; SENSITIVITY; SI SEMICONDUCTOR DETECTORS; SIGNAL-TO-NOISE RATIO; SILICON; TEMPERATURE RANGE; TEMPERATURE RANGE 0000-0013 K; TUNNEL EFFECT
- Descriptors DEC
- DIMENSIONLESS NUMBERS; ELECTRONIC EQUIPMENT; ELEMENTARY PARTICLES; ELEMENTS; EQUIPMENT; FERMIONS; LEPTONS; MATERIALS; MEASURING INSTRUMENTS; PHYSICS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR MATERIALS; SEMIMETALS; SEPARATION PROCESSES; SPECTRA; TEMPERATURE RANGE; TRANSISTORS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.